English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

For obtaining reliable nanostructural details of large amounts of sample ---and if it is applicable --- Small-Angle Scattering (SAS) is a prime techniqueto use. It promises to obtain bulk-scale, statistically sound information onthe morphological details of the nanostructure, and has thus led to many aresearcher investing their time in it over the last eight decades ofdevelopment. Due to pressure both from scientists requesting more details onincreasingly complex nanostructures, as well as the ever improvinginstrumentation leaving less margin for ambiguity, small-angle scatteringmethodologies have been evolving at a high pace over the last few decades.  As the quality of any results can only be as good as the data that goes intothese methodologies, the improvements in data collection and all imaginabledata correction steps are reviewed here. This work is intended to provide acomprehensive overview of all data corrections, to aid the small-anglescatterer to decide which are relevant for their measurement and how thesecorrections are performed. Clear mathematical descriptions of the correctionsare provided where feasible. Furthermore, as no quality data exists without adecent estimate of its precision, the error estimation and propagation throughall these steps is provided alongside the corrections. With these datacorrections, the collected small-angle scattering pattern can be made of thehighest standard allowing for authoritative nanostructural characterisationthrough its analysis. A brief background of small-angle scattering, theinstrumentation developments over the years, and pitfalls that may beencountered upon data interpretations are provided as well.

Everything SAXS: Small-angle scattering pattern collection and correction