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Solution derived La2Zr2O7 films have drawn much attention for potentialapplications as thermal barriers or low-cost buffer layers for coated conductortechnology. Annealing and coating parameters strongly affect the microstructureof La2Zr2O7, but different film processing methods can yield similarmicrostructural features such as nanovoids and nanometer-sized La2Zr2O7 grains.Nanoporosity is a typical feature found in such films and the implications forthe functionality of the films is investigated by a combination of scanningtransmission electron microscopy, electron energy-loss spectroscopy andquantitative electron tomography. Chemical solution based La2Zr2O7 filmsdeposited on flexible Ni-5at.%W substrates with a {100}<001> biaxial texturewere prepared for an in-depth characterization. A sponge-like structurecomposed of nanometer sized voids is revealed by high-angle annular dark-fieldscanning transmission electron microscopy in combination with electrontomography. A three-dimensional quantification of nanovoids in the La2Zr2O7film is obtained on a local scale. Mostly non-interconnected highly facettednanovoids compromise more than one-fifth of the investigated sample volume. Thediffusion barrier efficiency of a 170 nm thick La2Zr2O7 film is investigated bySTEM-EELS yielding a 1.8 \pm 0.2 nm oxide layer beyond which no significantnickel diffusion can be detected and intermixing is observed. This is ofparticular significance for the functionality of YBa2Cu3O7-{\delta} coatedconductor architectures based on solution derived La2Zr2O7 films as diffusionbarriers.

Barrier efficiency of sponge-like La2Zr2O7 buffer layers for YBCO-coated conductors