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Accurate data of complex permittivity of dielectric substrates are needed forefficient design of HTS microwave planar circuits. We have tested MgOsubstrates from three different manufacturing batches using a dielectricresonator with superconducting parts recently developed for precise microwavecharacterization of laminar dielectrics at cryogenic temperatures. Themeasurement fixture has been fabricated using a SrLaAlO3 post dielectricresonator with DyBa2Cu3O7 end plates and silver-plated copper sidewalls toachieve the resolution of loss tangent measurements of 2 {\times} 10-6. Thetested MgO substrates exhibited the average relative permittivity of 9.63 andtan {\delta} from 3.7 {\times} 10-7 to 2 {\times} 10-5 at frequency of 10.5 GHzin the temperature range from 14 to 80 K.

Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator