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We are aiming to identify the thin insulating inhomogeneities and smallconductive inhomogeneities inside an electrically conducting medium by usingmulti-frequency electrical impedance tomography (mfEIT). The thin insulatinginhomogeneities are considered in the form of tubular neighborhood of a curveand small conductive inhomogeneities are regarded as circular disks. Takingadvantage of the frequency dependent behavior of insulating objects, we give arigorous derivation of the potential along thin insulating objects at variousfrequencies. Asymptotic formula is given to analyze relationship betweeninhomogeneities and boundary potential at different frequencies. In numericalsimulations, spectroscopic images are provided to visualize the reconstructedadmittivity at various frequencies. For the view of both kinds ofinhomogeneities, an integrated reconstructed image based on principle componentanalysis (PCA) is provided. Phantom experiments are performed by using SwisstomEIT-Pioneer Set.

Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities