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Measurements of the exchange stiffness $D$ and the exchange constant $A$ ofYttrium Iron Garnet (YIG) films are presented. The YIG films with thicknessesfrom 0.9 $\mu$m to 2.6 $\mu$m were investigated with a microwave setup in awide frequency range from 5 to 40 GHz. The measurements were performed when theexternal static magnetic field was applied in-plane and out-of-plane. Themethod of Schreiber and Frait, based on the analysis of the perpendicularstanding spin wave (PSSW) mode frequency dependence on the applied out-of-planemagnetic field, was used to obtain the exchange stiffness $D$. This method wasmodified to avoid the influence of internal magnetic fields during thedetermination of the exchange stiffness. Furthermore, the method was adaptedfor in-plane measurements as well. The results obtained using all methods arecompared and values of $D$ between $(5.18\pm0.01) \cdot 10^{-17}$T$\cdot$m$^2$and $(5.34\pm0.02) \cdot 10^{-17}$ T$\cdot$m$^2$ were obtained for differentthicknesses. From this the exchange constant was calculated to be $A=(3.65 \pm0.38)~$pJ/m.

Measurements of the exchange stiffness of YIG films by microwave resonance techniques