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We re-analyse earlier measurements of resistance R and piezoresistance K inRuO2-based thick-film resistors. The percolating nature of transport in thesesystems is well accounted by values of the transport exponent t larger than itsuniversal value t=2.0. Furthermore, we show that the RuO2 volume fractiondependence of the piezoresistance data fit well with a logarithmicallydivergence at the percolation thresold. We argue that the universalitybreakdown and divergent piezoresistive response could be understood in theframework of a tunneling-percolating model proposed a few years ago to apply incarbon-black--polymer composites. We propose a new tunneling-percolating theorybased on the segregated microstructure common to many thick-film resistors, andshow that this model can in principle describe the observed universalitybreakdown and the divergent piezoresistance.Comment: 15 pages, 7 figures, (iopams.sty, stestack.sty

Critical behaviour of the piezoresistive response in RuO2–glass composites

Critical behaviour of the piezoresistive response in RuO₂–glass composites