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Rich soft X-ray emission lines of highly charged silicon ions (Si VI--Si XII)were observed by irradiating an ultra-intense laser pulse with width of 200 fsand energy of $\sim$90 mJ on the solid silicon target. The high resolutionspectra of highly charged silicon ions with full-width at half maximum (FWHM)of $\sim$0.3--0.4\AA is analyzed in wavelength range of 40--90 \AA . Thewavelengths of 53 prominent lines are determined with statistical uncertaintiesbeing up to 0.005 \AA . Collisional-radiative models were constructed for Si VI-- Si XII ions, which satisfactorily reproduces the experimental spectra, andhelps the line identification. Calculations at different electron densitiesreveal that the spectra of dense plasmas are more complicate than the spectraof thin plasmas. A comparison with the Kelly database reveals a good agreementfor most peak intensities, and differences for a few emission lines.

Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas