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Herein, lead sulphide (PbS) thin films were deposited on glass substrates at different deposition temperatures of 30, 40, 50 and 60°C by using the chemical bath deposition (CBD). X-Ray diffraction, UV-vis-NIR-Infrared spectrophotometry and scanning electron microscopy were used to investigate the effect of deposition temperature on the characteristic properties of the PbS thin films. The crystal identification through X-ray diffraction (XRD) revealed that the increasing in deposition temperature caused the increasing in grains sizes, and these sizes were found to be between 39.46 and 45.35 nm. Furthermore, it was found that the optical band gap Eg decreases from 0.97 eV to 0.87 eV when the deposition temperature increases. The present results set the foundations to further study the Lead sulphide (PbS) thin films as a promising material for various optoelectronic applications.

The temperature effect on the physical properties of PbS thin films produced by the chemical bath deposition (CBD) technique