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The crystallographic orientations and residual stresses within recrystallizing grains in partially recrystallized β titanium—Gum Metal—were examined non-destructively in 3D using synchrotron Differential Aperture X-ray Microscopy. Contrary to common assumptions, significant local stresses and stress variations are observed within the recrystallizing grains. The results reveal that the development of these local residual stresses depends on the plastic deformation mode and material’s elastic constants, rather than grain properties such as size and orientation, or even the material’s yield stress. This work provides insights valuable for the design of advanced materials with heterogeneous microstructures.

3D mapping of residual stresses in growing grains of partially recrystallized Gum Metal