English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

In this article, optimum path planning of elliptic and cubic nanoparticles by one and dual probe atomic force microscopes is investigated. Four different parameters are considered in the cost function, including area under critical time–force diagram, critical indentation depth, path smoothness and area under force–time diagram of primary impact of nanoparticles. Also three different obstacles are added to process to make it more real. The layout of obstacles are various in each geometry. Since surfaces are rough, the effects of roughness (surface and particle) are considered in process. Genetic algorithm method has been used for path planning.

Optimum path planning of elliptic and cubic nanoparticles using one and dual probe atomic force microscopes