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This article presents the stability and noise analysis of the negative capacitance cylindrical gate junction-less transistor (NC-CyJLT). Application of the negative capacitance concept has fetched very good results, where a sufficient reduction in power dissipation and reduced subthreshold swing is achieved. Results indicate that NC-CyJLT devices have reduced flicker and thermal noise, show a significant (63.6%) reduction in low-frequency noise and a reduction of 92.1% in thermal noise. Further, it has been proved that NC-CyJLT is the least affected due to temperature, hence, stability improves with low-power dissipation which suggests that the device is suitable for biomedical and sensor applications.

Low-Frequency Noise Characterization and Thermal Stability Analysis of Negative Capacitance Junction-Less Transistors