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In2S3thin films were deposited by flash evaporation of In2S3 powder. The effect of annealing in vacuum and undersulphur atmosphere on the structural and optical properties of these films was investigated. X-ray diffraction studies reveal that the as-deposited films are amorphous. The formation of β-In2S3 phase is obtained after annealing undervacuum at 693 K. Heat treatments under sulphur pressure lead to the formation of the above phase at a less annealing temperature (573 K). The energy dispersive X-ray (EDX) analysis reveals that the sulphurized films are nearly stoichiometric and those annealed in vacuum are sulphur deficient. Optical transmission spectra showed a slightshift of the absorption edge towards lower wavelengths. The optical gap value varied between 2.4 and 3 eV as a function of the film thickness and the annealing temperature

active and passive electronic components

Structural and Optical Properties of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" id="E1"><mml:mrow><mml:msub><mml:mrow><mml:mtext>In</mml:mtext></mml:mrow><mml:mn>2</mml:mn></mml:msub><mml:msub><mml:mtext>S</mml:mtext><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>Thin Films Prepared by Flash Evaporation

Structural and Optical Properties ofIn2S3Thin Films Prepared by Flash Evaporation