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Process capability indices such as  C p,  C pL,  C pU, and  C pkhave been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of  C pkis constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

Bayes estimator of process capability index C pk with a specified prior mean