English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Resistive random access memory is promising for next-generation nonvolatile memory, which has high memory density, low power consumption, and fast read/write speed. However, the resistive switching (RS) mechanism in oxide ferroelectric thin film devices is still unclear. In this paper, Pt/BiFeO 3 /La 0.5 Sr 0.5 CoO 3 (Pt/BFO/LSCO) heterostructures were deposited on (111)SrTiO 3 (STO) substrates by magnetron sputtering. X-ray diffraction confirmed the epitaxial relationship between (111)BFO//(111)LSCO//(111)STO. Atomic force microscopy (AFM) showed that (111)BFO had an island structure with uniform grain distribution. The Pt/(111)BFO/(111)LSCO heterostructures exhibit obvious ferroelectricity and RS effects. The results of C-V analysis and I-V fitting indicate that the RS is caused by the space-charge-limited conduction mechanism.

Dielectric properties and ferroelectric resistive switching mechanism in the epitaxial (111) BiFeO 3 films