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The solid solutions of the (1- x )BiFeO 3  –  x /2PbFe 1/2 Nb 1/2 O 3  - x /2PbFe 2/3 W 1/3 O 3  system ( x  = 0.05,  x  = 0.50) were produced by conventional solid state technology using mechanical activation (MA). It is discovered that particle destruction occurs along planar defects (crystallographic shear planes, CSP) during MA. The MA has a different impact on the microstructure formation of the solid solutions (1- x )BiFeO 3  –  x /2PbFe 1/2 Nb 1/2 O 3  –  x /2PbFe 2/3 W 1/3 O 3  system, depending on their localization on the phase diagram. It is shown that MA leads to an increase in the temperature stability of the dielectric properties in the solid solutions of the studied system.

Impact of mechanical activation on the crystal structure and dielectric properties of ceramics based on bismuth ferrite