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We present scanning tunneling microscopy (STM) images of single-layergraphene crystals examined under ultrahigh vacuum conditions. The samples, withlateral dimensions on the micron scale, were prepared on a silicon dioxidesurface by direct exfoliation of single crystal graphite. The single-layerfilms were identified using Raman spectroscopy. Topographic images ofsingle-layer samples display the honeycomb structure expected for the fullhexagonal symmetry of an isolated graphene monolayer. The absence of observabledefects in the STM images is indicative of the high quality of these films.Crystals comprised of a few layers of graphene were also examined. Theyexhibited dramatically different STM topography, displaying the reducedthree-fold symmetry characteristic of the surface of bulk graphite.

High-Resolution Scanning Tunneling Microscopy Imaging of Mesoscopic Graphene Sheets on an Insulating Surface