English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Ferroelectric HfO2 films are usually polycrystalline and contain a mixture ofpolar and nonpolar phases. This challenges the understanding and control ofpolar phase stabilization and ferroelectric properties. Several factors such asdopants, oxygen vacancies, or stress, among others, have been investigated andshown to have a crucial role on optimizing the ferroelectric response. Stressgenerated during deposition or annealing of thin films is a main factordetermining the formed crystal phases and influences the lattice strain of thepolar orthorhombic phase. It is difficult to discriminate between stress andstrain effects on polycrystalline ferroelectric HfO2 films, and the directimpact of orthorhombic lattice strain on ferroelectric polarization has yet tobe determined experimentally. Here, we analyze the crystalline phases andlattice strain of several series of doped HfO2 epitaxial films. We concludethat stress has a critical influence on metastable orthorhombic phasestabilization and ferroelectric polarization. On the contrary, the latticedeformation effects are much smaller than those caused by variations in theorthorhombic phase content. The experimental results are confirmed by densityfunctional theory calculations on HfO2 and Hf0.5Zr0.5O2 ferroelectric phases.

Disentangling stress and strain effects in ferroelectric HfO2