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We propose a simple method to measure nonlinear Kerr refractive index inmid-infrared frequency range that avoids using sophisticated infrareddetectors. Our approach is based on using a near-infrared probe beam whichinteracts with a mid-IR beam via wavelength-non-degenerate cross-phasemodulation (XPM). By carefully measuring XPM-induced spectral modifications inthe probe beam and comparing the experimental data with simulation results weextract the value for the non-degenerate Kerr index. Finally, in order toobtain the value of degenerate mid-IR Kerr index we use the well-establishedtwo-band formalism of Sheik-Bahae et al., which is shown to become particularlysimple in the limit of low frequencies. The proposed technique is complementaryto the conventional techniques such as z-scan and has the advantage of notrequiring any mid-infrared detectors.

Mid-infrared Kerr index evaluation via cross-phase modulation with a near-infrared probe beam