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We report the realization of an advanced technique for measuring relativelength changes $\Delta L/L$ of mm-sized samples under control of temperature($T$) and helium-gas pressure ($P$). The system, which is an extension of theapparatus described in Manna et al., Rev. Sci. Instrum. 83, 085111 (2012),consists of two $^4$He-bath cryostats each of which houses a pressure cell anda capacitive dilatometer. The interconnection of the pressure cells, thetemperature of which can be controlled individually, opens up various modes ofoperation to perform measurements of $\Delta L/L$ under variation oftemperature and pressure. Special features of this apparatus include thepossibilities (1) to increase the pressure to values much in excess of theexternal pressure reservoir, (2) to substantially improve the pressurestability during temperature sweeps, (3) to enable continuous pressure sweepsboth with decreasing and increasing pressure, and (4) to simultaneously measurethe dielectric constant of the pressure-transmitting medium helium,$\varepsilon_{\mathrm{r}}^{\mathrm{He}}(T,P)$, along the same $T$-$P$trajectory as used for taking the $\Delta L(T,P)/L$ data. The performance ofthe setup is demonstrated by measurements of relative length changes $(\DeltaL/L)_T$ at $T=180\,\mathrm{K}$ of single crystalline NaCl upon continuouslyvarying the pressure in the range $6\,\mathrm{MPa}\leq P \leq40\,\mathrm{MPa}$.

Advanced technique for measuring relative length changes under control of temperature and helium-gas pressure