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We present a thermodynamic analysis of the recently discovered nitrideferroelectric materials using the classic Landau-Devonshire approach. Theelectrostrictive and dielectric stiffness coefficients of Al1-xScxN withwurtzite structure (6mm) are determined using a free energy density functionassuming a hexagonal parent phase (6/mmm), with the first order phasetransition based on the dielectric stiffness relationships. The results of thisanalysis show that the strain sensitivity of the energy barrier is one order ofmagnitude larger than that of the spontaneous polarization in these novelwurtzite ferroelectrics, yet both are less sensitive to strain compared toclassic perovskite ferroelectrics. These analysis results reported here explainexperimentally reported sensitivity of coercive field to elastic strain/stressin Al1-xScxN films, and would enable further thermodynamic analysis via phasefield simulation and related methods.

A Landau-Devonshire Analysis of Strain Effects on Ferroelectric Al1-xScxN