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This study explores the potentialities of Scanning Thermal Microscopy (SThM)technique as a tool for measuring thermal transporting properties ofcarbon-derived materials issued from thermal conversion of organic polymers,such as the most commonly known polyimide (PI), Kapton. For quantitativemeasurements, the Null Point SThM (NP-SThM) technique is used in order to avoidunwanted effects as the parasitic heat flows through the air and the probecantilever. Kapton HN films were pyrolysed in an inert atmosphere attemperatures up to 1200{\deg}C to produce carbon-based residues with varyingdegree of conversion to free sp2 disordered carbon. The thermal conductivity ofcarbon materials ranges from 0.2 to 2 Wm-1K-1 depending on the temperature ofthe carbonization process (varied between 500{\deg}C and 1200{\deg}C). In orderto validate the applicability of NP-SThM approach to these materials, theresults were compared to those obtained with the three more traditionaltechniques, namely photo-thermal radiometry, flash laser analysis andmicro-Raman thermometry. It was found that NP SThM data are in excellentagreement with previous work using more traditional techniques. We used theNP-SThM technique to differentiate structural heterogeneities or imperfectionsat the surface of the pyrolysed Kapton on the basis of measured local thermalconductivity.

Nanoscale thermal conductivity of Kapton-derived carbonaceous materials