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We extend image scanning microscopy to second harmonic generation (SHG) byextracting the complex field amplitude of the second-harmonic beam. While thetheory behind coherent image scanning microscopy (ISM) is known, anexperimental demonstration wasn't yet established. The main reason is that thenaive intensity-reassignment procedure cannot be used for coherent scatteringas the point spread function is now defined for the field amplitude rather thanfor the intensity. We use an inline interferometer to demonstratesuper-resolved phase-sensitive SHG microscopy by applying the ISM reassignmentmachinery on the resolved field. This scheme can be easily extended to thirdharmonic generation and stimulated Raman microscopy schemes.

Super-resolved Second Harmonic Generation Imaging by Coherent Image Scanning Microscopy