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A transimpedance amplifier has been designed for scanning tunnelingmicroscopy (STM). The amplifier features low noise (limited by the Johnsonnoise of the 1 G{\Omega} feedback resistor at low input current and lowfrequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pFinput capacitance), a large dynamic range (0.1 pA--50 nA without rangeswitching), and a low input voltage offset. The amplifier is also suited forplacing its first stage into the cryostat of a low-temperature STM, minimizingthe input capacitance and reducing the Johnson noise of the feedback resistor.The amplifier may also find applications for specimen current imaging andelectron-beam-induced current measurements in scanning electron microscopy andas a photodiode amplifier with a large dynamic range. This paper also discussesthe sources of noise including the often neglected effect of non-balanced inputimpedance of operational amplifiers and describes how to accurately measure andadjust the frequency response of low-current transimpedance amplifiers.

Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond