English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Plus

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Zendy Tools

Zendy Open

Silicon thin films (2000–3000 A) were vacuum deposited onto graphite substrates held at 600 °C with a prior coating of an ultrathin Si‐Al‐Si (∼100‐500‐100 A) sandwich layer. X‐ray diffraction showed a considerable increase in silicon crystallinity over those directly deposited onto graphite at the same substrate temperature. The increase observed is comparable to that using quartz substrates. The distribution of aluminum in the silicon films thus deposited is determined using Auger spectroscopic depth profiling.

Enhanced crystallinity of low-temperature-deposited silicon films on graphite substrates