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We report on the design, commissioning, and initial measurements of aTransition-edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap(EBIT) at the National Institute of Standards and Technology (NIST). Over thepast few decades, the NIST EBIT has produced numerous studies of highly chargedions in diverse fields such as atomic physics, plasma spectroscopy, andlaboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer(NETS) improves the measurement capabilities of the EBIT through a combinationof high x-ray collection efficiency and resolving power. NETS utilizes 192individual TES x-ray microcalorimeters (166/192 yield) to improve upon thecollection area by a factor of ~30 over the 4-pixel neutron transmutation dopedgermanium-based microcalorimeter spectrometer previously used at the NIST EBIT.The NETS microcalorimeters are optimized for the x-ray energies from roughly500 eV to 8,000 eV and achieve an energy resolution of 3.7 eV to 5.0 eV overthis range, a more modest (<2X) improvement over the previousmicrocalorimeters. Beyond this energy range NETS can operate with varioustrade-offs, the most significant of which are reduced efficiency at lowerenergies and being limited to a subset of the pixels at higher energies. As aninitial demonstration of the capabilities of NETS, we measured transitions inHe-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energycalibration and data analysis techniques used to transform detector counts intox-ray spectra, a process that will be the basis for analyzing future data.

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A Transition-edge Sensor-based X-ray Spectrometer for the Study of  Highly Charged Ions at the National Institute of Standards and Technology  Electron Beam Ion Trap