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Thin film lithium niobate is of great recent interest and an understanding ofperiodically poled thin-films is crucial for both fundamental physics anddevice developments. Second-harmonic (SH) microscopy allows for thenon-invasive visualization and analysis of ferroelectric domain structures andwalls. While the technique is well understood in bulk lithium niobate, SHmicroscopy in thin films is largely influenced by interfacial reflections andresonant enhancements, which depend on film thicknesses and the substratematerials. We present a comprehensive analysis of SH microscopy in x-cutlithium niobate thin films, based on a full three dimensional focuscalculations, and accounting for interface reflections. We show that thedominant signal in back-reflection originates from a co-propagatingphase-matched process observed through reflections, rather than directdetection of the counter-propagating signal as in bulk samples. We can explainthe observation of domain structures in the thin film geometry, and inparticular, we show that the SH signal from thin poled films allows tounambiguously distinguish areas, which are completely or only partly invertedin depth.

Second harmonic microscopy of poled x-cut thin film lithium niobate: Understanding the contrast mechanism