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In this work, we investigate the accumulative polarization (P) switchingcharacteristics of ferroelectric (FE) thin films under the influence ofsequential electric-field pulses. By developing a dynamic phase-fieldsimulation framework based on time-dependent Landau-Ginzburg model, we analyzeP excitation and relaxation characteristics in FE. In particular, we show thatthe domain-wall instability can cause different spontaneousP-excitation/relaxation behaviors that, in turn, can influence P switchingdynamics for different pulse sequences. By assuming a local and globaldistribution of coercive field among the grains of an FE sample, we model theP-accumulation process in Hf0.4Zr0.6O2 (HZO) and its dependency on appliedelectric field and excitation/relaxation time. According to our analysis,domain-wall motion along with its instability under certain conditions plays apivotal role in accumulative P-switching and the corresponding excitation andrelaxation characteristics.

Phase Field Modeling of Domain Dynamics and Polarization Accumulation in Ferroelectric HZO