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We have developed an improved method of time-resolved x-ray reflectivity(XRR) using monochromatic synchrotron radiation. Our method utilizes apolycapillary x-ray optic to create a range of incident angles and an areadetector to collect the specular reflections. By rotating the sample normal outof the plane of the incident fan, we can separate the surface diffuse scatterfrom the reflectivity signal, greatly improving the quality of the XRR spectracompared to previous implementations. We demonstrate the time-resolvedcapabilities of this system, with temporal resolution as low as 10 ms, bymeasuring XRR during the annealing of Al/Ni nano-scale multilayers and use thisinformation to extract the activation energy for interdiffusion in this system.

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation