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The electric field-dependence of structural dynamics in a tetragonalferroelectric lead zirconate titanate thin film is investigated undersub-coercive and above-coercive fields using time-resolved X-ray diffraction.During the application of an external field to the pre-poled thin filmcapacitor, structural signatures of domain nucleation and growth includebroadening of the in-plane peak width of a Bragg reflection concomitant with adecrease of the peak intensity. This disordered domain state is remanent andcan be erased with an appropriate voltage pulse sequence.

Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields