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Spectroscopic-imaging scanning tunneling microscopy is a powerful techniqueto study quantum materials, with the ability to provide information about thelocal electronic structure with subatomic resolution. However, as mostspectroscopic measurements are conducted without feedback to the tip, it isextremely sensitive to vibrations coming from the environment. This requiresthe use of laboratories with low-vibration facilities combined with a veryrigid microscope construction. In this article, we report on the design andfabrication of an ultra-stable STM for spectroscopic-imaging measurements thatoperates in ultra high vacuum and at low temperatures (4 K). We perform finiteelement analysis calculations for the main components of the microscope inorder to guide design choices towards higher stiffness and we choose sapphireas the main material of the STM head. By combining these two strategies, weconstruct a STM head with measured lowest resonant frequencies above f0=13 kHzfor the coarse approach mechanism, a value three times higher than previouslyreported, and in good agreement with the calculations. With this, we achieve anaverage vibration level of $\sim$ 6 fm/sqrt(Hz), without a dedicatedlow-vibration lab. We demonstrate the microscope's performance with topographicand spectroscopic measurements on the correlated metal Sr2RhO4, showing thequasiparticle interference pattern in real and reciprocal space with highsignal-to-noise ratio.

Definition of design guidelines, construction and performance of an ultra-stable scanning tunneling microscope for spectroscopic imaging