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Slender liquid nanofilms exposed to large surface thermal gradients are knownto undergo thickness fluctuations which rapidly self-organize into arrays ofnanoprotrusions with a separation distance of tens of microns. We previouslyreported good agreement between measurements of the characteristic spacing andthe wavelength of the most unstable mode predicted by a linear stabilityanalysis based on a long wavelength thermocapillary model. Here we focus ondifferential colorimetry measurements to quantify early time out-of-planegrowth of protrusions for peak heights spanning 20 to 200 nm. Analysis of peakheights based on shape reconstruction reveals robust exponential growth. Goodquantitative agreement of the growth rates with the thermocapillary model isobtained using a single fit constant to account for material parameters ofnanofilms that could not be measured directly. These findings lend furthersupport to the conjecture that the array protrusions uncovered almost twodecades ago stem from a linear instability whose growth rate is controlled bythermocapillary forces counterbalanced by capillary forces.

Differential Colorimetry Measurements of Fluctuation Growth in Nanofilms Exposed to Large Surface Thermal Gradients