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The microwave cavity perturbation method is often used to determine materialparameters (electric permittivity and magnetic permeability) at highfrequencies and it relies on measurement of the resonator parameters. Wepresent a method to determine the $Q$-factor and resonance frequency ofmicrowave resonators which is conceptually simple but provides a sensitivityfor these parameters which overcomes those of existing methods by an order ofmagnitude. The microwave resonator is placed in a feedback resonator setup,where the output of an amplifier is connected to its own input with theresonator as a band pass filter. After reaching steady-state oscillation, thefeedback circuit is disrupted by a fast microwave switch and the transientsignal, which emanates from the resonator, is detected using down-conversion.The Fourier transform of the resulting time-dependent signal yields directlythe resonance profile of the resonator. Albeit the method is highly accurate,this comes with a conceptual simplicity, ease of implementation and lowercircuit cost. We compare existing methods for this type of measurement toexplain the sensitivity of the present technique and we also make a predictionfor the ultimate sensitivity for the resonator $Q$ and $f_0$ determination.

A highly accurate measurement of resonator $Q$-factor and resonance frequency