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Fil: Pazos, Sebastian Matias. Consejo Nacional de Investigaciones Cientificas y Tecnicas; Argentina. Universidad Tecnologica Nacional. Facultad Regional Buenos Aires; Argentina

journal of applied physics

Lack of correlation between C-V hysteresis and capacitance frequency dispersion in accumulation of metal gate/high-<i>k</i>/n-InGaAs metal-oxide-semiconductor stacks

Lack of correlation between C-V hysteresis and capacitance frequency dispersion in accumulation of metal gate/high-k/n-InGaAs metal-oxide-semiconductor stacks