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Transient negative capacitance effects in epitaxial ferroelectricPb(Zr$_{0.2}$Ti$_{0.8}$)O$_3$ capacitors are investigated with a focus on thedynamical switching behavior governed by domain nucleation and growth. Voltagepulses are applied to a series connection of the ferroelectric capacitor and aresistor to directly measure the ferroelectric negative capacitance duringswitching. A time-dependent Ginzburg-Landau approach is used to investigate theunderlying domain dynamics. The transient negative capacitance is shown tooriginate from reverse domain nucleation and unrestricted domain growth.However, with the onset of domain coalescence, the capacitance becomes positiveagain. The persistence of the negative capacitance state is therefore limitedby the speed of domain wall motion. By changing the applied electric field,capacitor area or external resistance, this domain wall velocity can be variedpredictably over several orders of magnitude. Additionally, detailed insightsinto the intrinsic material properties of the ferroelectric are obtainablethrough these measurements. A new method for reliable extraction of the averagenegative capacitance of the ferroelectric is presented. Furthermore, a simpleanalytical model is developed, which accurately describes the negativecapacitance transient time as a function of the material properties and theexperimental boundary conditions.

Ferroelectric Negative Capacitance Domain Dynamics