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Anisotropic thermal properties are of both fundamental and practicalinterests, but remain challenging to characterize using conventional methods.In this work, a new metrology based on asymmetric beam time-domainthermoreflectance (AB-TDTR) is developed to measure three-dimensionalanisotropic thermal transport by extending the conventional TDTR technique.Using an elliptical laser beam with controlled elliptical ratio and spot size,the experimental signals can be exploited to be dominantly sensitive to measurethermal conductivity along the cross-plane or any specific in-plane directions.An analytic solution for a multi-layer system is derived for the AB-TDTR signalin response to the periodical pulse, elliptical laser beam, and heatinggeometry, to extract the anisotropic thermal conductivity from experimentalmeasurement. Examples with experimental data are given for various materialswith in-plane thermal conductivity from 5 W/mK to 2000W/mK, including isotropicmaterials (silicon, boron phosphide, boron nitride), transversely isotropicmaterials (graphite, quartz, sapphire) and transversely anisotropic materials(black phosphorus). Furthermore, a detailed sensitivity analysis is conductedto guide the optimal setting of experimental configurations for differentmaterials. The developed AB-TDTR metrology provides a new approach toaccurately measure anisotropic thermal phenomena for rational materials designand thermal applications.

Anisotropic thermal conductivity measurement using a new Asymmetric-Beam Time-Domain Thermoreflectance (AB-TDTR) method