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We present the development, manufacturing and performance of spherically bentcrystal analyzers (SBCAs) of 100 mm diameter and 0.5 m bending radius. Theelastic strain in the crystal wafer is partially released by a "strip-bent"method where the crystal wafer is cut in strips prior to the bending and theanodic bonding process. Compared to standard 1 m SBCAs, a gain in intensity isobtained without loss of energy resolution. The gain ranges between 2.5 and4.5, depending on the experimental conditions and the width of the emissionline measured. This reduces the acquisition times required to perform highenergy-resolution x-ray absorption and emission spectroscopy on ultra-dilutespecies, accessing concentrations of the element of interest down to, or below,the ppm (ng/mg) level.

High energy-resolution x-ray spectroscopy at ultra-high dilution with spherically bent crystal analyzers of 0.5 m radius