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Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging
Author(s) -
Libor Kovařík,
Andrew Stevens,
Andrey Liyu,
Nigel D. Browning
Publication year - 2016
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4965720
Subject(s) - image resolution , scanning transmission electron microscopy , resolution (logic) , optics , sampling (signal processing) , materials science , microscope , beam (structure) , sample (material) , computer science , electron microscope , artificial intelligence , physics , detector , thermodynamics

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