English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Tools annual

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Presents the access of premium content as premium feature

Premium Content

Global: Zendy Plus annual

Global: Zendy Free Plan

Magnetoelectric coupling in ferromagnet/multiferroic systems is oftenmanifested in the exchange bias effect, which may have combined contributionsfrom multiple sources, such as domain walls, chemical defects or strain. Inthis study we magnetically "fingerprint" the coupling behavior of CoFe grown onepitaxial BiFeO3 (BFO) thin films by magnetometry andfirst-order-reversal-curves (FORC). The contribution to exchange bias from71{\deg}, 109{\deg} and charged ferroelectric domain walls (DWs) was elucidatedby the FORC distribution. CoFe samples grown on BFO with 71{\deg} DWs onlyexhibit an enhancement of the coercivity, but little exchange bias. Samplesgrown on BFO with 109{\deg} DWs and mosaic DWs exhibit a much larger exchangebias, with the main enhancement attributed to 109{\deg} and charged DWs. Basedon the Malozemoff random field model, a varying-anisotropy model is proposed toaccount for the exchange bias enhancement. This work sheds light on therelationship between the exchange bias effect of the CoFe/BFO heterointerfaceand the ferroelectric DWs, and provides a path for multiferroic device analysisand design.

Magnetic fingerprint of interfacial coupling between CoFe and nanoscale ferroelectric domain walls