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Series connection of four quantum Hall effect (QHE) devices based onepitaxial graphene films was studied for realization of a quantum resistancestandard with an up-scaled value. The tested devices showed quantum Hallplateaux RH,2 at filling factor i = 2 starting from relatively low magneticfield (between 4 T and 5 T) when temperature was 1.5 K. Precision measurementsof quantized Hall resistance of four QHE devices connected by triple seriesconnections and external bonding wires were done at B = 7 T and T = 1.5 K usinga commercial precision resistance bridge with 50 microA current through the QHEdevice. The results showed that the deviation of the quantized Hall resistanceof the series connection of four graphene-based QHE devices from the expectedvalue of 4*RH,2 = 2h/e^2 was smaller than the relative standard uncertainty ofthe measurement (< 1*10^-7) limited by the used resistance bridge.

Mini array of quantum Hall devices based on epitaxial graphene