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In this work, we present a new X-band waveguide (WR90) measurement methodthat permits the broadband characterization of the complex permittivity for lowdielectric loss tangent material specimens with improved accuracy. Anelectrically-long polypropylene specimen that partially fills the cross-sectionis inserted into the waveguide and the transmitted scattering parameter (S21)is measured. The extraction method relies on computational electromagneticsimulations, coupled with a genetic algorithm, to match the experimental S21measurement. The sensitivity of the technique to sample length was explored bysimulating specimen lengths from 2.54 to 15.24 cm, in 2.54 cm increments.Analysis of our simulated data predicts the technique will have the sensitivityto measure loss tangent values on the order of 10e-3 for materials such aspolymers with relatively low real permittivity values. The ability toaccurately characterize low-loss dielectric material specimens of polypropyleneis demonstrated experimentally. The method was validated by excellent agreementwith a free-space focused-beam system measurement of a polypropylene sheet.This technique provides the material measurement community with the ability toaccurately extract material properties of low-loss material specimen over theentire X-band range. This technique could easily be extended to other frequencybands.

An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity