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Femtosecond electron microscopy produces real-space images of matter in aseries of ultrafast snapshots. Pulses of electrons self-disperse underspace-charge broadening, so without compression, the ideal operation mode is asingle electron per pulse. Here, we demonstrate for the first time femtosecondsingle-electron point projection microscopy (fs-ePPM) in a laser-pumpfs-e-probe configuration. The electrons have an energy of only 150 eV and taketens of picoseconds to propagate to the object under study. Nonetheless, weachieve a temporal resolution with a standard deviation of 120 fs, combinedwith a spatial resolution of 100 nm, applied to a localized region of charge atthe apex of a nanoscale metal tip induced by 30 fs 800 nm laser pulses at 50kHz. These observations demonstrate real-space imaging of reversible processessuch as tracking charge distributions is feasible whilst maintainingfemtosecond resolution. Our findings could find application as acharacterization method, which, depending on geometry could resolve tens offemtoseconds and tens of nanometres. Dynamically imaging electric and magneticfields and charge distributions on sub-micron length scales opens new avenuesof ultrafast dynamics. Furthermore, through the use of active compression, suchpulses are an ideal seed for few-femtosecond to attosecond imaging applicationswhich will access sub-optical cycle processes in nanoplasmonics.

Femtosecond single- to few-electron point-projection microscopy for nanoscale dynamic imaging