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Electric response of an x-ray mirror enclosed in a gas flow ionizationchamber was studied under the conditions of total external reflection for hardx-rays. It is shown that the electric response of the system as a function ofthe incidence angle is defined by x-ray Fresnel transmissivity andphoton-electron attenuation properties of the mirror material. A simpleinterpretation of quantum yield of the system is presented. The approach couldserve as a basis for non-invasive in-situ diagnostics of hard x-ray optics,easy access to complementary x-ray transmissivity data in x-ray reflectivityexperiments and might also pave the way to advanced schemes for angle andenergy resolving x-ray detectors.

Self-detection of x-ray Fresnel transmissivity using photoelectron-induced gas ionization