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We have used a photothermal technique, in which chopped light heats the frontsurface of a small ( ~ 1 mm2) sample and the chopping frequency dependence ofthermal radiation from the back surface is measured with a liquid nitrogencooled infrared detector. In our system, the sample is placed directly in frontof the detector within its dewar. Because the detector is also sensitive tosome of the incident light which leaks around or through the sample,measurements are made for the detector signal that is in quadrature with thechopped light. Results are presented for layered crystals of semiconducting6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-pn) and for papers ofcellulose nanofibrils coated with semiconductingpoly(3,4-ethylene-dioxythiophene):poly(styrene-sulfonate) (NFC-PEDOT). ForNFC-PEDOT, we have found that the transverse diffusivity, smaller than thein-plane value, varies inversely with thickness, suggesting that texturing ofthe papers varies with thickness. For TIPS-pn, we have found that theinterlayer diffusivity is an order of magnitude larger than the in-plane value,consistent with previous estimates, suggesting that low-frequency opticalphonons, presumably associated with librations in the TIPS side-groups, carrymost of the heat.

Frequency-Dependent Photothermal Measurement of Transverse Thermal Diffusivity of Organic Semiconductors