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We report an investigation of the structural and electronic properties ofhybrid superconductor/ferromagnet (S/F) bilayers of compositionNb/Cu$_{60}$Ni$_{40}$ prepared by magnetron sputtering. X-ray and neutronreflectometry show that both the overall interfacial roughness and verticalcorrelations of the roughness of different interfaces are lower forheterostructures deposited on Al$_2$O$_3$(1$\bar{1}$02) substrates than forthose deposited on Si(111). Mutual inductance experiments were then used tostudy the influence of the interfacial roughness on the superconductingtransition temperature, $T_C$. These measurements revealed a $\sim$ 4% higher$T_C$ in heterostructures deposited on Al$_2$O$_3$, compared to those on Si. Weattribute this effect to a higher mean-free path of electrons in the S layer,caused by a suppression of diffusive scattering at the interfaces. However, thedependence of the $T_C$ on the thickness of the ferromagnetic layer is notsignificantly different in the two systems, indicating a weak influence of theinterfacial roughness on the transparency for Cooper pairs.

Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures