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The piezoelectronic transduction switch is a device with potential as a post–CMOS transistor due to its predicted multi-GHz, low voltage performance on the VLSI-scale. However, the operating principle of the switch has wider applicability. We use theory and simulation to optimize the device across a wide range of length scales and application spaces and to understand the physics underlying its behavior. We show that the four-terminal VLSI-scale switch can operate at a line voltage of 115 mV while as a low voltage-large area device, ≈200 mV operation at clock speeds of ≈2 GHz can be achieved with a desirable 104 On/Off ratio—ideal for on–board computing in sensors. At yet larger scales, the device is predicted to operate as a fast (≈250 ps) radio frequency (RF) switch exhibiting high cyclability, low On resistance and low Off capacitance, resulting in a robust switch with a RF figure of merit of ≈4 fs. These performance benchmarks cannot be approached with CMOS which has reached fundamental limits. In deta...

The piezoelectronic stress transduction switch for very large-scale integration, low voltage sensor computation, and radio frequency applications