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In this work, we explore the hardening mechanisms in WB4-based solid solutions upon addition of Ta, Mn, and Cr using in situ radial X-ray diffraction techniques under non-hydrostatic pressure. By examining the lattice-supported differential strain, we provide insights into the mechanism for hardness increase in binary solid solutions at low dopant concentrations. Speculations on the combined effects of electronic structure and atomic size in ternary WB4solid solutions containing Ta with Mn or Cr are also included to understand the extremely high hardness of these materials.

Exploring hardness enhancement in superhard tungsten tetraboride-based solid solutions using radial X-ray diffraction