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An optical characterization tool of Raman spectroscopy with extremely weakscattering cross section tool is not popular to analyze scattered signal from asingle nanostructure in the sub-diffraction regime. In this regard, plasmonicassisted characterization tools are only relevant in spectroscopic studies ofnanoscale object in the sub-diffraction limit. We have reported polarizedresonance Raman spectroscopic (RRS) studies with strong electron-phononcoupling to understand the crystalline orientation of a single AlGaN nanowireof diameter about 100 nm. AlGaN nanowire is grown by chemical vapor depositiontechnique using the catalyst assisted vapor-liquid-solid process. The resultsare compared with the high resolution transmission electron microscopicanalysis. As a matter of fact, optical confinement effect due to the dielectriccontrast of nanowire with respect to that of surrounding media assisted withelectron-phonon coupling of RRS are useful for the spectroscopic analysis inthe sub-diffraction limit of 325 nm (lamda(2N.A.)^(-1)) using an excitationwavelength (lamda) of 325 nm and near ultraviolet 40X far field objective witha numerical aperture (N.A.) value of 0.50.

Optically confined polarized resonance Raman studies in identifying crystalline orientation of sub-diffraction limited AlGaN nanostructure