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The coercivity and resistivity of a Pt/Co/AlOx/Pt junction are measured undersustained voltage application. High bias voltages of either polarity aredetermined to cause a strongly enhanced, reversible coercivity modificationcompared to low voltages. Time-resolved measurements show a logarithmicdevelopment of the coercive field in this regime, which continues over a periodas long as thirty minutes. Furthermore, the resistance of the dielectricbarrier is found to change strongly and reversibly on the same time scale,suggesting an electrochemical process is taking place within the dielectric. Itis argued that the migration of oxygen vacancies at the magnet/oxide interfacecould explain both the resistance variation and the enhanced electric fieldeffect at high voltages. A thermal fluctuation aftereffect model is applied toaccount for the observed logarithmic dependence.

Large time-dependent coercivity and resistivity modification under sustained voltage application in a Pt/Co/AlOx/Pt junction