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We demonstrate photon-noise limited performance at sub-millimeter wavelengthsin feedhorn-coupled, microwave kinetic inductance detectors (MKIDs) made of aTiN/Ti/TiN trilayer superconducting film, tuned to have a transitiontemperature of 1.4~K. Micro-machining of the silicon-on-insulator waferbackside creates a quarter-wavelength backshort optimized for efficientcoupling at 250~\micron. Using frequency read out and when viewing a variabletemperature blackbody source, we measure device noise consistent with photonnoise when the incident optical power is $>$~0.5~pW, corresponding to noiseequivalent powers $>$~3$\times 10^{-17}$ W/$\sqrt{\mathrm{Hz}}$. Thissensitivity makes these devices suitable for broadband photometric applicationsat these wavelengths.

Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors