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We investigate the mechanical properties of a doubly-clamped, double-layernanobeam embedded into an electromechanical system. The nanobeam consists of ahighly pre-stressed silicon nitride and a superconducting niobium layer. Bymeasuring the mechanical displacement spectral density both in the linear andthe nonlinear Duffing regime, we determine the pre-stress and the effectiveYoung's modulus of the nanobeam. An analytical double-layer modelquantitatively corroborates the measured values. This suggests that this modelcan be used to design mechanical multilayer systems for electro- andoptomechanical devices, including materials controllable by external parameterssuch as piezoelectric, magnetrostrictive, or in more general multiferroicmaterials.

Determination of effective mechanical properties of a double-layer beam by means of a nano-electromechanical transducer